Compact SER Models for Line-Source-Induced Charge Collection Using Model Order Reduction

Pavlos Stoikos, Olympia Axelou, Pelopidas Tsoumanis, Georgios Ioannis Paliaroutis, Luigi Dilillo, Anuj Pathania, George Floros
January 2025
PDF DOI
Type
Conference paper
Publication
IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2025, Barcelona, Spain, October 21-23, 2025